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ACD/Curve Processor
What's New
- Improved annotation of delta X and Y
Download a PDF copy of the expanded details on What's New with ACD/Curve Manager (including ACD/Curve Processor), or contact your Account Manager or Distributor.
General Processing and Visualization Features
- Selectively show/hide analytical traces in series
- Copy shown-data from series to their own window
- Apply custom coloration schemes to series more easily
- Manually zoom on curve feature of interest
- Interactively apply offset through the series display
Automation
- Automatically apply macros across all selected analytical files in the Processor window
- New macro commands:
- Delete a specified analytical type from database records using a macro
- Copy only the shown spectra/curves in a series to their own window macro
- Set database update options quickly to custom preferences using a macro
Processing and Analysis Features
- Use relative curve series offset to auto-adjust the offset used in accordance to the data set size.
- Conveniently lock the default window display range to an area of interest. Easily toggle between the full view to lock the display range, facilitating global and detailed analyses.
- Draw or fit lines to curves for DSC, TGA, porosity, potentiometry data, and more:
- Determine intersection points between lines to determine onset and endset points.
- Obtain the midpoints for intermediate lines.
- Better organize your data with the new X-Ray data type introduced for x-ray powder diffraction and fluorescence type spectra.
Processing and Analysis Features
- Gain greater clarity and insight by applying overlaid curve offsets to
analytical series to better spot trends.
- Simplify annotations of complex analytical curves with multiple annotation
layers .
- Link data from related techniques in a clear hierarchical
system:
- Live curve data can be linked directly to a single data point or peak
within a chromatogram, spectrum, or another analytical curve.
- Import TA Instrument data files with the updated format specifications
- Import x-ray powder diffraction data in STOE format .
General Features
- Enhance spectrum identification through the windowpane information
display of key information.
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This page was last updated
01 December 2008
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